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IDT71V2558S डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - 3.3V Synchronous ZBT SRAMs 2.5V I/O - Integrated Device Technology

भाग संख्या IDT71V2558S
समारोह 3.3V Synchronous ZBT SRAMs 2.5V I/O
मैन्युफैक्चरर्स Integrated Device Technology 
लोगो Integrated Device Technology लोगो 
पूर्व दर्शन
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IDT71V2558S pdf
IDT71V2556, IDT71V2558, 128K x 36, 256K x 18, 3.3V Synchronous ZBT™ SRAMs
with 2.5V I/O, Burst Counter, and Pipelined Outputs
Commercial and Industrial Temperature Ranges
Pin Definitions(1)
Symbol
Pin Function
I/O Active
Description
A0-A17
Address Inputs
I N/A Synchronous Address inputs. The address register is triggered by a combination of the rising edge of
CLK, ADV/LD low, CEN low, and true chip enables.
ADV/LD
Advance / Load
I N/A ADV/LD is a synchronous input that is used to load the internal reg isters with new address and control
when it is sampled low at the rising edge of clock with the chip selected. When ADV/ LD is low with the
chip deselected, any burst in progress is terminated. When ADV/LD is sampled high then the internal
burst counter is advanced for any burst that was in progress. The external addresses are ignored
when ADV/LD is sampled high.
R/W
Read / Write
I N/A R/W signal is a synchronous input that identifies whether the current load cycle initiated is a Read or
Write access to the memory array. The data bus activity for the current cycle takes place two clock
cycles later.
CEN
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Clock Enable
I LOW Synchronous Clock Enable Input. When CEN is sampled high, all other synchronous inputs, including
clock are ignored and outputs remain unchanged. The effect of CEN sampled high on the device
outputs is as if the low to high clock transition did not occur. For normal operation, CEN must be
sampled low at rising edge of clock.
BW1-BW4
Individual Byte
Write Enables
I LOW Synchronous byte write enables. Each 9-bit byte has its own active low byte write enable. On load
write cycles (When R/W and ADV/LD are sampled low) the appropriate byte write signal (BW1-BW4)
must be valid. The byte write signal must also be valid on each cycle of a burst write. Byte Write
signals are ignored when R/W is sampled high. The appropriate byte(s) of data are written into the
device two cycles later. BW1-BW4 can all be tied low if always doing write to the entire 36-bit word.
CE1, CE2
Chip Enables
I LOW Sy nchronous active low chip enable. CE1 and CE2 are used with CE2 to enable the IDT71V2556/58.
(CE1 or CE2 sampled high or CE2 sampled low) and ADV/LD low at the rising edge of clock, initiates a
deselect cycle. The ZBTTM has a two cycle deselect, i.e., the data bus will tri-state two clock cycles
after deselect is initiated.
CE2
Chip Enable
I HIGH Synchronous active high chip enable. CE2 is used with CE1 and CE2 to enable the chip. CE2 has
inverted polarity but otherwise identical to CE1 and CE2.
CLK
Clock
I N/A This is the clock input to the IDT71V2556/58. Except for OE, all timing referenc es for the device are
made with respect to the rising edge of CLK.
I/O0-I/O31
I/OP1-I/OP4
Data Input/Output
I/O N/A Synchronous data input/output (I/O) pins. Both the data input path and data output path are registered
and triggered by the rising edge of CLK.
LBO Linear Burst Order I LOW Burst order selection input. When LBO is high the Interleaved burst sequence is selected. When LBO
is low the Linear burst sequence is selected. LBO is a static input and it must not change during
device operation.
OE
Output Enable
I LOW Asynchronous output enable. OE must be low to read data from the 71V2556/58. When OE is high the
I/O pins are in a high-impedance state. OE does not need to be actively controlled for read and write
cycles. In normal operation, OE can be tied low.
TMS
Test Mode Select
I
N/A
Gives input command for TAP controller. Sampled on rising edge of TDK. This pin has an internal
pullup.
TDI
Test Data Input
I
N/A
Serial input of registers placed between TDI and TDO. Sampled on rising edge of TCK. This pin has
an internal pullup.
TCK
Test Clock
I
N/A
Clock input of TAP controller. Each TAP event is clocked. Test inputs are captured on rising edge of
TCK, while test outputs are driven from the falling edge of TCK. This pin has an internal pullup.
TDO
Test Data Output
O
N/A
Serial output of registers placed between TDI and TDO. This output is active depe nding on the state of
the TAP controller.
TRST
JTAG Reset
(Optional)
Optional Asynchronous JTAG reset. Can be used to reset the TAP controller, but not required. JTAG
I LOW reset occurs automatically at power up and also resets using TMS and TCK per IEEE 1149.1. If not
used TRST can be left floating. This pin has an internal pullup.
Synchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the
ZZ
Sleep Mode
I HIGH IDT71V2556/2558 to its lowest power consumption level. Data retention is guaranteed in Sleep Mode.
This pin has an internal pulldown
VDD
Power Supply
N/A N/A 3.3V core power supply.
VDDQ
Power Supply
N/A N/A 2.5V I/O Supply.
VSS
Ground
N/A N/A Ground.
NOTE:
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
6.422
4875 tbl 02

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