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IDT54FCT3245 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - 3.3V CMOS OCTAL BIDIRECTIONAL TRANSCEIVERS - Integrated Device Technology

भाग संख्या IDT54FCT3245
समारोह 3.3V CMOS OCTAL BIDIRECTIONAL TRANSCEIVERS
मैन्युफैक्चरर्स Integrated Device Technology 
लोगो Integrated Device Technology लोगो 
पूर्व दर्शन
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IDT54FCT3245 pdf
IDT54/74FCT3245/A
3.3V CMOS OCTAL BIDIRECTIONAL TRANSCEIVERS
PIN DESCRIPTION
Pin Names
Description
OE Output Enable Input (Active LOW)
DIR Direction Control Input
Ax Side A Inputs or 3-State Outputs
Bx Side B Inputs or 3-State Outputs
MILITARY AND COMMERCIAL TEMPERATURE RANGES
2650 tbl 01
FUNCTION TABLE(1)
Inputs
OE DIR
Outputs
L L Bus B Data to Bus A
L H Bus A Data to Bus B
H X High Z State
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
Z = High Impedance
2650 tbl 02
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
VTERM(2) Terminal Voltage
with Respect to
GND
VTERM(3) Terminal Voltage
with Respect to
GND
VTERM(4) Terminal Voltage
with Respect to
GND
TA Operating
Temperature
TBIAS Temperature
Under Bias
TSTG Storage
Temperature
PT Power Dissipation
Commercial
–0.5 to +4.6
–0.5 to +7.0
–0.5 to
VCC + 0.5
–40 to +85
–55 to +125
–55 to +125
1.0
Military
–0.5 to +4.6
–0.5 to +7.0
–0.5 to
VCC + 0.5
–55 to +125
–65 to +135
–65 to +150
1.0
Unit
V
V
V
°C
°C
°C
W
IOUT
DC Output
–60 to +60 –60 to +60 mA
Current
NOTES:
2650 lnk 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other condi-
tions above those indicated in the operational sections of this specifica-
tion is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Output and I/O terminals.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter(1)
CIN Input
Capacitance
CI/O I/O
Capacitance
Conditions Typ. Max. Unit
VIN = 0V
3.5 6.0 pF
VOUT = 0V 4.0 8.0 pF
NOTE:
2650 lnk 04
1. This parameter is measured at characterization but not tested.
8.12 2

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