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IDT71V3559S डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - 3.3V Synchronous ZBT SRAMs - IDT

भाग संख्या IDT71V3559S
समारोह 3.3V Synchronous ZBT SRAMs
मैन्युफैक्चरर्स IDT 
लोगो IDT लोगो 
पूर्व दर्शन
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IDT71V3559S pdf
IDT71V3557, IDT71V3559, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
ZBT™ Feature, 3.3V I/O, Burst Counter, and Flow-Through Outputs
Commercial and Industrial Temperature Ranges
Pin Definitions (1)
Symbol
Pin Function
I/O Active
Description
A0-A17
Address Inputs
I N/A Synchronous Address inputs. The address register is triggered by a combination of the rising edge of CLK,
ADV/LD low, CEN low, and true chip enables.
ADV/LD
Advance / Load
I N/A ADV/LD is a synchronous input that is used to load the internal registers with new address and control when it
is sampled low at the rising edge of clock with the chip selected. When ADV/ LD is low with the chip
deselected, any burst in progress is terminated. When ADV/LD is sampled high then the internal burst
counter is advanced for any burst that was in progress. The external addresses are ignored when ADV/ LD is
sampled high.
R/W
Read / Write
I N/A R/W signal is a synchronous input that identifies whether the current load cycle initiated is a Read or Write
access to the memory array. The data bus activity for the current cycle takes place one clock cycle later.
CEN
Clock Enable
I LOW Sy nchronous Clock Enable Input. When CEN is sampled high, all other synchronous inputs, including clock
are ignored and outputs remain unc hanged. The effect of CEN sampled high on the device outputs is as if
the low to high clock transition did not occur. For normal operation, CEN must be samp led low at rising edge
of clock.
BW1-BW4
Individual Byte
Write Enables
I LOW Synchronous byte write enables. Each 9-bit byte has its own active low byte write enable. On load write
cycles (When R/W and ADV/LD are sampled low) the appropriate byte write signal (BW1-BW4) must be valid.
The byte write signal must also be valid on each cycle of a burst write. Byte Write signals are ignored when
R/W is sampled high. The appropriate byte(s) of data are written into the device one cycle later. BW1-BW4
can all be tied low if always doing write to the entire 36-bit word.
CE1, CE2
Chip Enables
I LOW Synchronous active low chip enable. CE1 and CE2 are used with CE2 to enable the IDT71V3557/59. (CE1 or
CE2 sampled high or CE2 sampled low) and ADV/LD low at the rising edge of clock, initiates a deselect
cycle. The ZBTTM has a one cycle dese lect, i.e., the data bus will tri-state one clock cycle after deselect is
initiated.
CE2
Chip Enable
I HIGH Synchronous active high chip enable. CE2 is used with CE1 and CE2 to enable the chip. CE2 has inverted
polarity but otherwise identical to CE1 and CE2.
CLK
Clock
I N/A This is the clock input to the IDT71V3557/59. Except for OE, all timing references fo r the device are made
with respect to the rising edge of CLK.
I/O0-I/O31
Data Input/Output
I/O N/A Data input/output (I/O) pins. The data input path is registered, triggered by the rising edge of CLK. The data
I/OP1-I/OP4
output path is flow-through (no output register).
LBO Linear Burst Order I LOW Burst order selection input. When LBO is high the Interleaved burst sequence is selected. When LBO is low
the Linear burst sequence is selected. LBO is a static input, and it must not change during device operation..
OE
Output Enable
I LOW Asynchronous output enable. OE must be low to read data from the 71V3557/59. When OE is HIGH the I/O
pins are in a high-impedance state. OE does not need to be actively controlled for read and write cycles. In
normal operation, OE can be tied low.
TMS Test Mode Select I N/A Gives input command for TAP controller. Sampled on rising edge of TDK. This pin has an internal pullup.
TDI
Test Data Input
I
N/A
Serial input of registers placed between TDI and TDO. Sampled on rising edge of TCK. This pin has an
internal pullup.
TCK
Test Clock
I
N/A
Clock input of TAP controller. Each TAP event is clocked. Test inputs are captured o n rising edge of TCK,
while test outputs are driven from the falling edge of TCK. This pin has an internal pullup.
TDO
Test Data Output
O
N/A
Serial output of registers placed between TDI and TDO. This output is active depending on the state of the
TAP controller.
TRST
JTAG Reset
(Optional)
Optional Asynchronous JTAG reset. Can be used to reset the TAP controller, but not required. JTAG reset
I LOW occurs automatically at power up and also resets using TMS and TCK per IEEE 1149.1. If not used TRST can
be left floating. This pin has an internal pullup.
Synchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the IDT71V3557/3559 to
ZZ
Sleep Mode
I HIGH its lowest power consumption level. Data retention is guaranteed in Sleep Mode. This pin has an internal
pulldown.
VDD
Power Supply
N/A N/A 3.3V core power supply.
VDDQ
Power Supply
N/A N/A 3.3V I/O Supply.
VSS
Ground
N/A N/A Ground.
NOTE:
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
5282 tbl 02
6.422

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