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AT84AS001 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - 12-bit 500 Msps ADC - e2v

भाग संख्या AT84AS001
समारोह 12-bit 500 Msps ADC
मैन्युफैक्चरर्स e2v 
लोगो e2v लोगो 
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AT84AS001 pdf
AT84AS001
4. Applications
Test and Measurement Instrumentation
Radar and Satellite Receiver Subsystems
Wireless and Wired Communications Receivers
Medical Imaging
High-speed Data Acquisition
5. Description
The AT84AS001 is a high-performance 12-bit 500 Msps ADC featuring low-power consumption and true
12-bit linearity for IF sampling applications. By using its on-chip S/H circuitry and advanced high-speed
process technology, it allows conversion of wide-bandwidth signals up to 500 MHz of input frequency at
500 Msps. Its electrical performance is coupled with ease of integration into new or existing designs by
such features as AC or DC coupled analog input, differential LVDS compatible output, 3-wire serial inter-
face (gain and offset control, standby mode, Built-In Test), double data rate clock output and
synchronous reset input.
6. Specifications
6.1 Absolute Maximum Ratings
Table 6-1. Absolute Maximum Ratings
Parameter
Analog positive supply voltage
Digital positive supply voltage
Output supply voltage
Maximum difference between DVCCA and VCCD
Maximum difference between VCCD and VCCO
Analog input voltages (AC)
on each singled-ended input
Digital input voltage (3WSI)
Clock input voltage
Maximum difference between VCLKI and VCLKIN
RESET input voltage
Maximum difference between
VRESET and VRESETN
Maximum junction temperature
Storage temperature
Symbol
VCCA
VCCD
VCCO
DVCCA to VCCD
VCCD to VCCO
VIN or VINN
VD
VCLKI or VCLKIN
VCLKI - VCLKIN
VRESET or VRESETN
VRESET - VRESETN
TJ
Tstg
Comments
Value
6
3.6
3.6
±2.5
±1.5
±2
–0.3 to VCCO + 0.3
–0.3 to VCCD + 0.3
–2 to 2
–0.3 to VCCD + 0.3
–2 to 2
125
–65 to 150
Unit
V
V
V
V
V
V peak
V
V
V
V
V
C
C
Note:
Absolute maximum ratings are limiting values (referenced to GND = 0V), to be applied individually, while other parameters are
within specified operating conditions. Long exposure to maximum rating might affect device reliability. All integrated circuits have
to be handled with appropriate care to avoid damages due to ESD. Damage caused by inappropriate handling or storage could
range from performance degradation to complete failure.
2
0858D–BDC–06/14
e2v semiconductors SAS 2014

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